报告题目：Outlook and Challenges of Electrostatic Discharge (ESD) Protection of Modern and Future Integrated Circuits

报告人：Juin J. Liou教授  

                University of Central Florida, Orlando, Florida, USA

                Pegasus Distinguished Professor and Lockheed Martin St. Laurent Professor of Engineering

                Chang Jiang Scholar Endowed Professor, Ministry of Education, China

                Fellow of IEEE, Fellow of IET, Fellow of AAAS

报告时间：2016年5月19日（星期四） 上午9：30-11：00

报告地点：信息学馆301

邀请人：杨杰 教授

摘要：Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and hence more than 35% of chip damages can be attributed to the ESD event.  As such, designing on-chip ESD structures to protect integrated circuits against the ESD stress is a high priority in the semiconductor industry. The continuing advancement in MOS processing technology makes the ESD-induced failures even more prominent. In fact, many semiconductor companies worldwide are having difficulties in meeting the increasingly stringent ESD protection requirements for various electronics applications, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential factor to the well-being and commercialization of modern and future electronics.

An overview on the ESD sources, models, protection schemes, and testing will first be given in this talk. This is followed by presenting the challenges of designing and realizing ESD protection solutions for integrated circuits in Si CMOS, Si BiCMOS, GaAs, GaN, and emerging technologies. Challenges and difficulties associated with the ESD design and optimization for these technologies will be addressed. 

简历：Juin J. Liou is the UCF Pegasus Distinguished Professor and Lockheed Martin St. Laurent Professor of Engineering. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design and simulation. He is the Fellow of IEEE, Fellow of IET, Fellow of AAAS, Fellow of Singapore Institute of Manufacturing Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of IEEE Electron Device Society (EDS), and Distinguished Lecturer of National Science Council. He holds several honorary professorships, including the Chang Jiang Scholar Endowed Professor of Ministry of Education, China (教育部长江学者）

Dr. Liou holds 9 U.S. patents (3 more filed and pending), and has published 13 books (1 more in press), more than 280 journal papers (including 21 invited review articles), and more than 220 papers (including more than 100 keynote and invited papers) in international and national conference proceedings. He has been awarded more than $14.0 million of research contracts and grants from federal agencies (i.e., NSF, DARPA, Navy, Air Force, NASA, NIST), state government, and industry, and has held consulting positions with research laboratories and companies in the United States, China, Japan, Taiwan, and Singapore. Dr. Liou has served as the IEEE EDS Vice-President of Regions/Chapters, IEEE EDS Treasurer, IEEE EDS Finance Committee Chair, Member of IEEE EDS Board of Governors, and Member of IEEE EDS Educational Activities Committee.